Shop

FTPL10 Fourier transform Photoluminescence Spectrometer

  • Near-infrared photoluminescence measurements, covering 800 – 2500nm
  • Dual excitation light source (532/671nm), excitation light can be customized
  • Pre-optimize the collimated light path, without calibration
  • Quick scan, the fastest 1 spectrum per second
Quote and Query

Description

Photoluminescence (PL) spectroscopy is widely used as an effective non-destructive spectroscopy tool for band gap detection, impurity defect analysis, compounding mechanisms, and quality identification of semiconductors.

However, in the infrared region, where photoluminescence is a weak signal detection field, the existing measurement systems on the market require a high level of spectroscopic experimental skills from the user who has to make time-consuming and laborious adjustments to the optical path in order to find the weak PL spectral signal, and the spectral measurement results are often difficult to guarantee.

Fourier transform (FT) spectroscopy has a well-established theoretical and instrumental basis. Compared to conventional dispersive spectrometers, FT offers the advantages of multiple channels, full flux, low equivalent noise, and fast scanning. The signal-to-noise ratio and detection sensitivity are improved by an order of magnitude, making it ideally suited for spectral measurements in the infrared band.

Fully drawing on more than 20 years of experience in weak signal and IRPL spectroscopy, INSA Optics developers have launched the FTPL-10 FTPL photoluminescence spectrometer for the first time with fully independent intellectual property rights.

The FTPL-10 offers excellent detection of weak signals in the infrared band and very fast measurement speeds. Its ease of use and application reduce the user’s threshold requirements. It has an effective measurement range of 4000-12500 cm-1 (800-2500 nm), continuously adjustable pump laser power, and sample temperature conditions from room temperature to 77K.

Applications

Frontier Optoelectronic Materials Science Research

Rare Earth Light Emitting Material Performance Testing

Semiconductor Wafer Quality Testing

Quality testing of infrared optoelectronic components

    purchase
    Cart