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Nd:YLF – Neodymium Doped Yttrium Lithium Fluoride

Nd:YLF is grown by using Czochralski method with high quality starting materials for crystal growth. We inspect the whole boules with interferometry and their scattering particles with He-Ne laser.

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Description

Introduction

  • Rod sizes from 2 mm to 10 mm in diameter and from 1 mm to 150 mm in length
  • Orientation of rod axis to crystal axis <1 degree
  • Polished only or AR coated rods
  • Nd dopant concentrations between 0.4 and 1.2 at.%
  • Large rod and slab dimensions and non-standard dopant concentrations are available upon request

 

Table 1. Basic Properties

Chemical Formula LiY1.0-xNdxF4
Crystal Structure Tetragonal
Space Group I41/a
Nd (at/cm3) 1.40 × 1020 at/cm3 for 1% Nd doping
Modulus of Elasticity 85 GPa
Lattice Parameter a = 5.16 Å, c = 10.85 Å
Melting Point 819℃
Mohs Hardness 4~5 Mohs
Density 3.99 g/cm3
Thermal Conductivity 0.063 W/cm/K
Specific Heat 0.79 J/g/K
Thermal Expansion Coefficient 8.3 × 10-6 /K∥c, 13.3×10-6 /K⊥c

 

 Table 2. Optical Properties

Transparency Range 180-6700 nm
Peak Stimulated Emission Cross Section 1.8 × 10-19 /cm2 (E∥c) at 1047 nm

1.2 × 10-19 /cm2  (E⊥c) at 1053 nm

Fluorescence Lifetime 485 µs for 1% Nd doping
Scatter Losses <0.2% /cm
Peak Absorption Coefficient

(for 1.2% Nd)

α = 10.8 cm-1 (792.0 nm E∥c)

α = 3.59 cm-1 (797.0 nm E⊥c)

Laser Wavelength 1047 nm (∥c, a-cut crystal)

1053 nm (⊥c, a or c-cut crystal)

Sellmeier Equations (λ in µm):
no2 = 1.38757 + 0.70757λ2 / (λ2 – 0.00931) + 0.18849λ2 / (λ2 – 50.99741)

ne2 = 1.31021 + 0.84903λ2 / (λ2 – 0.00876) + 0.53607λ2 / (λ2 – 134.9566)

 

Table 3. Index of Refraction

Wavelength (nm) no ne
262 1.485 1.511
350 1.473 1.491
525 1.456 1.479
1050 1.448 1.47
2065 1.442 1.464

 

Table 4. dn / dT

Wavelength (nm) E // c E ⊥ c
436 -2.44 × 10-6/℃ -0.54 × 10-6/℃
578 -2.86 × 10-6/℃ -0.91 × 10-6/℃
1060 -4.30 × 10-6/℃ -2.00 × 106/℃

 

Specifications of Nd:YLF crystal

Table 5. Specifications

Standard Dopant Concentration Nd: 1.1 ± 0.1%
Surface quality (scratch/dig) 10/5 to MIL-PRF-13830B
Wavefront Distortion ≦λ/4 @633 nm
Surface Flatness λ/8 @633 nm
Parallelism 20 arc sec
Perpendicularity ≦15 arc min
Chamfer ≦0.2 mm × 45°
End Coating R<0.15% @1047/1053 nm

 

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